Thursday, September 13

08:30 - 10:00 Session One

The History of Our National Measurement Laboratory N. Belecki, Chair

NBS - The First Sixty Years, L. A. Greenhouse, NIST Historian

The first sixty years of the National Bureau of Standards were marked by the maturation of the United States as an industrial nation and the birth of modern science. From the very first, NBS staff supported the growth of industry through the establishment of national standards and measurement services, and gained an international reputation for fundamental advancements in science and metrology. Experiments at NBS contributed heavily to the move away from then-prevalent recipe-and-artifact based units to the physics-based Absolute System of Units, the predecessor to the present SI, which was adopted in 1960.

The Emergence of Modern Metrology - 1962 to the Present, J. F. Schooley, NBS and NIST (ret.)

Metrology at NBS/NIST over the past forty years continued to be driven by science, particularly atomic physics, and increasingly by technology, particularly in semiconductors. This era saw the development of quantum standards, widespread automation of measurement systems, better understanding of metrology through systems approaches and modeling, and serious work on the meaning of uncertainty and better ways to quantify and express it. Measurement technology affected and is affected by the increasingly global nature of trade and international adoption of protocols to ensure universal compatibility of measurement results.

10:00 - 10:30 Break

10:30 - 12:45 Session Two

Into Our Second Century (Presentations and Workshop) J. F. Mayo-Wells, NIST, Chair

Electrometrology and NIST - New Directions J. F. Mayo-Wells, Electronics and Electrical Engineering Laboratory, NIST

I gaze into a somewhat cloudy crystal ball to predict the directions of electrical metrology in the next fifteen years. The emphasis on standards based on fundamental constants of nature and on quantum-mechanical principles will move from the base units to the derived, from the laboratory to the marketplace. The need for NIST to lead the world in implementing fundamental electrical measurements will not change. What will change are the methods through which NIST transfers its measurement accuracy to its customers, making full use of the Internet (e.g., SIMnet) and offspring of the coming marriage of wireless and digital technologies.

NIST Length and Dimensional Metrology in 2015 D. A. Swyt, Manufacturing Engineering Laboratory, NIST

The paper outlines prospects for NIST length and dimensional metrology for 2015 based upon industry trends and NIST work underway. Trends include: tightening of tolerances in aircraft, automobiles, computers and microelectronics; a shift from national to international documentary standards governing industrial metrology, and requirements for specification of uncertainty of shop-floor measurements. Among NIST responses to these trends are research on absolute-distance interferometry, optical-frequency lasers tied directly to the primary frequency standard, and means to achieve more-direct access the SI unit of length in shop-floor measurements and measurement services based upon greater use of quality management and information technology.

Chemical Metrology: Future Developments W. F. Koch, Chemical Science and Technology Laboratory, NIST

Chemical metrology is of critical importance for assuring improved quality of life, reducing health care costs, improving the efficiency of manufacturing processes and facilitating international trade. Chemical measurements traceable to national standards are critical to ensure that US manufactured products and commodities are freely traded in the international marketplace without encountering trade barriers. Rapid development of advanced technology areas such as nanotechnology and biotechnology are creating new demands for chemical measurements that are more selective and sensitive, and provide higher spatial resolution. NIST Chemical Science and Technology Laboratory is poised to anticipate and address the chemical metrology needs of the 21st century.

Optical and Ionizing Radiation Metrology in 2015 K. B. Gebbie, Physics Laboratory, NIST

The NIST Physics Laboratory provides measurement services and standards for optical radiation, ionizing radiation, and time and frequency and develops related measurement methods. We will discuss possible metrology needs in these areas driven by such trends as: increasing use of ionizing and optical radiation measurements to support advances in medical diagnosis, treatment, and research; increasing reliance on optical measurements for advanced manufacturing; and increasing reliance on wireless networks requiring spatial and temporal synchronization supported by stringent time and frequency standards. We will also discuss stringent new measurements needed to support advances in nanotechnology and laser manipulation of atoms.

Discussion of Future Metrology Needs Speakers and Audience. For more information contact Norm Belecki at n.belecki@ieee.org.

12:45 - 13:30 Lunch, NIST Cafeteria

13:30 - 15:00 Session Three

ASQ Certification (Presentations and Panel) C. L. Grachanen, Compaq Computer, Chair ASQ Certification

Obtaining Performance Excellence S. Harthun, ASQ Headquarters
- Overview of ASQ's Certification Programs Creating a New ASQ Certification: A Roadmap to Success C. L. Grachanen, Compaq Computer
- Overview of the ASQ procedure for creating a new certification program Certified Calibration Technician Program (CCT) Update: Milestones to Success J. Smith, General Electric Co.
- Overview of the CCT program to the present

Panel Discussion (Speakers plus P. G. Stein, Philip G. Stein Consultants)

15:00 - 15:15 Break

15:15 - 17:00 Session Four

Laboratory Accreditation: Transition to ISO 17025, N. B. Belecki, Consultant

International Agreements and News P. Unger, A2LA

International arrangements for mutual recognition and confidence development will be discussed along with news from ILAC, and the world's regional accreditation organizations.

The Importance of Traceability and Uncertainty Analyses to the Effectiveness of ISO 17025 Accreditation, C. D. Faison, NVLAP

Traceability is a key aspect, if not the key aspect, of laboratory accreditation. The requirement for traceability ensures that results of measurements made by an accredited laboratory are expressed in terms of the SI units and common standards, and thus are compatible with those of other accredited labs throughout the world. Traceability is intimately linked to uncertainty analysis, the results of which give a quantitative statement of the metrological worth of a measurement result. Moreover, without careful analyses of measurement uncertainties, a laboratory's scope of accreditation is qualitative at best, and the evaluation of its capabilities becomes either meaningless or impossible.

ISO 17025 Accreditation from the Perspective of Small, Independent Laboratories M. Smith, WESCAN Calibrations Services

Smaller laboratories are confronting their need to accredit, wondering how to do it affordably, and worrying about how to prosper in what they see as an increasingly complex business. Their major concerns are accreditation, personnel, training, maintaining technical expertise and survival. As part of the NCSLI Small Business Initiative Committee activities, we surveyed laboratories by questionnaire. This paper presents an analysis of the responses and comments on their perspectives.

ISO 17025 Accreditation in a Large Company Environment D. Deaver, Fluke Co.

A look inside the labs of a larger company shows it has many of the same accreditation issues as a smaller company. However, some issues are relevant more to the larger labs. Some of these are mutual recognition agreements, corporate metrology spanning the globe, multiple labs in the same facility, measurement differences between national labs, and high level and intrinsic standards. Panel Discussion (Speakers and Audience)

19:00 Conference Dinner: Recognition of NIST Centennial (Holiday Inn)

K. Brown, Acting Director, NIST (tentative)
D. Allen, Chair, ASQ Measurement Quality Division
P. Stein, Director, ASQ
N. Belecki, Conference Chair

Friday, September 14

08:30 - 10:00 Session Five

Calculation of Measurement Uncertainty Consistent with the U. S. Guide ANSI/NCSL Z540-2-1997. T. W. Vetter, NIST

Chair Simple methods based on commonly available spreadsheets, and a software specifically developed for calculation of measurement uncertainty will be introduced. Practical examples will be used for illustration.

A Spreadsheet Approach to Evaluate Measurement Uncertainty D. A. Shah, E = MC3 Solutions

A computer spreadsheet model is developed to illustrate measurement uncertainty determination in accordance with the U. S. Guide to the Expression of Uncertainty in Measurement (ANSI/NCSL Z540-2-1997). Several examples and techniques are discussed to ensure that the participants leave the session with practical and timesaving techniques.

Quantifying Measurement Uncertainty: An Approach Using The Kragten Spreadsheet T. W. Vetter, NIST

Guidelines for planning an analysis and realistically estimating the magnitude of uncertainty sources will be presented using an example from analytical chemistry. Combining uncertainty components and calculating the expanded uncertainty will be demonstrated using a Kragten spreadsheet.

Software Uncertainty Calculator, C. L. Grachanen, Compaq Computer Corporation

A new release of the software Uncertainty Calculator will be introduced. It is a freeware program available for downloading from multiple web sites, and is used by thousands of calibration and testing laboratories throughout the world including many of the Fortune 100 companies, top measurement institutes and universities. Panel Discussion (Speakers and Audience)

10:00 - 10:30 Break

10:30 - 12:45 Session Six

Measure for Six Sigma... Six Sigma for Measurements T. A. Pearson, Tom Pearson Consulting, Chair

The MEASURE step is the first step in the powerful Six Sigma business improvement process. More importantly, Six Sigma's reliance on quantitative methods across the entire process demand the best measurement inputs for faster, better, overall business improvements to be achieved. Join the panel in a discussion of what Metrology can learn form Six Sigma, and what Six Sigma can learn from Metrology. Learn how the growing reliance on Information Products and Intellectual Property opens the opportunity for a symbiotic relationship between Metrology and Six Sigma.

Six-Sigma Background - The DEFINE Step, T. A. Pearson, Tom Pearson Consulting

The DEFINE step focuses on the critical infrastructure required for the overall Six Sigma business improvement process . Six Sigma success requires definition of a good overall corporate plan, design of measurement systems that produce good information products, development of management information systems that deliver organization wisdom, and deployment of an integrated Six Sigma support infrastructure. A good DEFINE step requires good measurement system planning, and leads to faster overall improvement. Discussions of how the Define step impacts all four of the remaining steps will be included in this introductory section.

Six-Sigma Background - The MEASURE and ANALYZE. Steps S. Windsor, Filltronic Comtek

These steps focus on measuring how key process input and output variables perform, and analyzing how they relate to each other and overall business improvement. The goal is getting meaningful baseline measurements, conversion to a common unit of measure (dollars), and understanding how measurements relate to improved business outcomes such as increased volume (throughput), quality (Yield/DPMO), cycle times, and cost (hidden factory). Measurement science techniques for measuring results where it is not possible to measure inputs directly will be discussed. For example, characteristics that relate to assembly or tuning/adjustment times may be difficult or expensive to measure. Where this is the case process outputs can be measured and related to measurable process characteristics upstream. Drawing conclusions from results of highly variable measurements and understanding that Six Sigma may involve pushing the limits of tradition guidelines for measurements (i.e. 10:1 accuracy ratios, and decision-making on very high confidence intervals) can also help with the Measure and Analyze steps.

Six-Sigma Background - The IMPROVE and CONTROL Steps P. G. Stein, Philip G. Stein Consultants

The IMPROVE and CONTROL steps focus on techniques to improve overall results (DOE, EDA, Creative Problem Solving, Rival Hypothesis) and Control key processes, especially the critical measurement processes, with both statistical methods and compliance systems. A discussion of how measurement uncertainty fits in will end this talk.

12:45 - 13:30 Lunch Break (NIST Cafeteria)

13:30 - 15:30 Session Seven

Metrology and Quality Education and Training Prospects,

Chair
D. Nebel, Electronic Distributors, Inc
Panelists:
C. Bautista, MMI Cal Labs
D. Schiebel, Butler County Community College
E. E. Watson, California State University - Dominguez Hills

There is increasing concern in industry and academia that the effects of changing technology on various measurement disciplines and application areas will couple with accreditation requirements for formal training and education to create a shortage of adequately prepared metrologists in the future. This is not a trivial problem to address because the requirements are multidimensional. Various levels of education will be required from short courses through A.S. and bachelor degrees to advanced degrees. The needs differ from one measurement field to another. It appears that an understanding of the overall picture of need and the technological and legal drivers for it and the participation of educators, metrology managers, companies, and metrologists will be required to find ways of coping with this peculiar and difficult challenge. This session will explore the feasibility of a national metrology education forum as a means for exploring solutions.

15:30 Conference Close

15:30 - 15:45 Break

15:45 - 16:30 Advanced Measurement Laboratory Overview

16:30 Return to Hotel

For more information contact Norm Belecki at n.belecki@ieee.org.